Nano surface roughness and shape measuring instrument Nano Seven
Easy operation, non-contact, rapid, high resolution, low-cost nano surface roughness and step shape measurement device. No vibration isolation table is required, making it possible for full inspection on the production line.
A compact surface roughness and shape measurement system that utilizes optical heterodyne interferometry, providing vibration resistance and high precision measurements with a height resolution of 0.1 nanometers. Measurement time can be significantly reduced, and it allows for full inspection on the production line without the need for an anti-vibration table. It is capable of extensive measurements and can be applied to multi-point measurements and large samples. <Main Features> 1) Significant reduction in measurement time at a low cost 2) High resolution with a height direction of 0.1 nanometers, maintaining compatibility with AFM 3) Simple measurements without the need for sample pre-treatment or vacuum, eliminating the need for an anti-vibration table 4) Capability for extensive measurements 5) External vibrations are canceled out through optical heterodyne interferometry, etc.
- 企業：シスコム（SysCom）
- 価格：5 million yen-10 million yen
